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Big Memory 12h Ultrasonic Ndt Flaw Detector Equipment With Solid Metal Housing

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China SINO AGE DEVELOPMENT TECHNOLOGY, LTD. certification
China SINO AGE DEVELOPMENT TECHNOLOGY, LTD. certification
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Big Memory 12h Ultrasonic Ndt Flaw Detector Equipment With Solid Metal Housing

Big Memory 12h Ultrasonic Ndt Flaw Detector Equipment With Solid Metal Housing
Big Memory 12h Ultrasonic Ndt Flaw Detector Equipment With Solid Metal Housing

Large Image :  Big Memory 12h Ultrasonic Ndt Flaw Detector Equipment With Solid Metal Housing

Product Details:
Place of Origin: Made In China
Brand Name: SADT
Certification: ISO9001
Model Number: SUD50
Payment & Shipping Terms:
Minimum Order Quantity: 1 pc
Price: USD1000-3000/Pcs
Packaging Details: Standard package with carton
Delivery Time: within 3 days after receipt of advanced payment
Payment Terms: T/T in advance
Supply Ability: 50pcs/week
Detailed Product Description
Measuring Range (mm): 0.5~10000 Frequency Range (MHz): 0.5~20
Measurement Mode: Single, Dual, THRU Dimension: 238mm×160mm×48mm
Net Weight: 1.0kg Standards: JB/T 10061-1999, JJG 746-2004
Continue Working Time: 12h Warranty: 1 Year
Key Words: Ultrasonic Flaw Detector
High Light:

12h ultrasonic flaw detection equipment

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12H ndt flaw detector

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Big Memory ndt flaw detector

Portable Ultrasonic Flaw Detector Microprocessor-Based With Digital Integration
 
 

SUD series ultrasonic flaw detectors are portable, microprocessor-based instruments that are suitable for both shop and field use. They are integrated with international advanced digital integration and new EL display technology, are smart Digital Ultrasonic Flaw Detector propelled by SADT. SUD series flaw detectors have almost all functions to meet requirements of professional application for nondestructive testing.

 

SUD50 is a more portable model with better functions.


Features:

  • Automatic calibration of transducer Zero Offset and/or Velocity ;
  • Automatic gain, Peak Hold and Peak Memory;
  • Automatic display precise flaw location (Depth d, level p, distance s, amplitude, sz dB, ф);
  • Automatic switch three staff gauge ((Depth d, level p, distance s);
  • 100 independence setup, any criterion can be input freely, we can work in the scene without test block;
  • Big memory of 1000 A graph.
  • Gate and DAC alarm;Acoustic-Optical alarm;
  • RS232/USB port, communication with pc is easy;
  • The embeded software can be online updated;
  • Li battery, continue working time up to 8 hours;
  • Display freeze;
  • Automated echo degree;
  • Angles and K-value;
  • DAC, AVG , TCG , B Scan ;
  • AWS;
  • Automated calculate the size of the flaw with w ide bottom type in AVG function.
  • 6dB DAC functions;
  • Provides high contrast viewing of the waveform from bright, direct sunlight to completae darkness and easy to read from all angles;
  • Powerful pc software and reports can be export to excel;


Technical Parameters


 

Designation Technical Data
Range of scanning (mm) Range of scanning (mm): 0~10000
Steps: 2.5,5,10,20, 30,40,50,60,70,80,90, 100,150,200, 250, 300, 350, 400,
450,500,600,700,800,900,1000,2000,3000,4000,5000,6000,7000,8000,10000
Adjusting step: 0.1mm(2.5 mm~99.9mm), 1mm(100mm~10000mm)
D-delay (µs) D-delay (µs): -20~+3400
Steps: -20,-10,0.0, 10, 20, 50,100,150,200,250,300,350,400,450,500, 600,
700,800,900,1000,1500,2000,2500,3000,3400.
Adjusting steps: 0.1(-20µs~999.9µs), 1(1000µs~3400µs)
P-delay (µs) P-delay: 0.0~99.99
Adjusting steps: 0.01
MTLVEL(m/s) MTLVEL: 1000~15000
10 fixed levels:
2260,2730,3080,3230,4700,5920,630012000,13000,14000,15000
Adjusting steps: 1
Working mode Single probe (receiving and sending), double probe (one for receiving and
another for sending), transmission (transmission probe)
Frequency Range (MHz) 0.5~20
Gain adjustment (dB) 0~120
Adjusting step: 0.0, 0.1, 0.5, 1, 2, 6, 12
Reject 0%~80% of screen height, step: 1%
Vertical linear error Vertical linear error is not more than 3%
Horizontal linear error Not more than 0.2% in the scanning range
Sensitivity Leavings ≥62 dB
Dynamic range ≥34dB
Alarm Three modes, i.e. forbidden wave, loss wave and auto
A-Scan display area Full screen or local
A-Scan display freezing and de-freezing A-Scan filling
Data save 1000 A-Scan images (including setting of instrument)
Standard communication
interface with PC
RS232/USB
Measuring unit mm/inch
Battery Li battery 7.4V 4800mAh
Power adaptor Input 100V~240V/50Hz~60Hz
Output 9VDC/1.5A
Working temperature -20℃~50℃
Working humidity 20%~90%
Port type BNC
Overall dimension (mm) 50×160×238
Weight (kg) 1.0

 

Sino Age Development Technology, Ltd. (SADT), established in 1993, is a leading manufacturer for measuring and testing instrument, specialized in NDT and quality control fields. We have our own HARTIP series portable hardness testers since 1995. We are professional producer with ISO 9001 quality system. Most of the products are applied with CE certificate.

Now our main products cover hardness tester, ultrasonic thickness gauge, concrete test hammer, gloss meter, colorimeter, roughness tester, metallurgical microscope, ultrasonic flaw detector and so on. We have exported our products in batch quantity to overseas market since 1996. Our main overseas markets are: USA, Canada, Germany, France, Netherlands, Finland, Italy, Czech Republic, Poland, Lithuania, Estonia, Serbia, Russia, Greece, Turkey, Australia, New Zealand, Korea, Taiwan, Singapore, Thailand, Indonesia, Malaysia, Vietnam, India, Pakistan, Iran, UAE, Egypt, South Africa, Mexico and Columbia, Peru and etc. All products supplied by SADT have excellent quality and competitive price with our best service.

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Contact Details
SINO AGE DEVELOPMENT TECHNOLOGY, LTD.

Tel: +8613801161787

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