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Portable Hardness Tester
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Portable Leeb Hardness Tester
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Hardness Tester
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Ultrasonic Thickness Gauge
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Concrete Test Hammer
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Brinell Hardness Testing
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Rockwell Hardness Tester
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Vickers Hardness Tester
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Gloss Meter
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Color Difference Meter
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Metallurgical Microscope
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Surface Roughness Tester
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Ultrasonic Flaw Detector
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Portable Vibration Meter
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Paul FrameThank you very much for all your help regarding the SADT Concrete Hammer and hardness tester which are working well and we are very pleased with it.
Big Memory 12h Ultrasonic Ndt Flaw Detector Equipment With Solid Metal Housing
Place of Origin | Made In China |
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Brand Name | SADT |
Certification | ISO9001 |
Model Number | SUD50 |
Minimum Order Quantity | 1 pc |
Price | USD1000-3000/Pcs |
Packaging Details | Standard package with carton |
Delivery Time | within 3 days after receipt of advanced payment |
Payment Terms | T/T in advance |
Supply Ability | 50pcs/week |

Contact me for free samples and coupons.
Whatsapp:0086 18588475571
Wechat: 0086 18588475571
Skype: sales10@aixton.com
If you have any concern, we provide 24-hour online help.
xMeasuring Range (mm) | 0.5~10000 | Frequency Range (MHz) | 0.5~20 |
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Measurement Mode | Single, Dual, THRU | Dimension | 238mm×160mm×48mm |
Net Weight | 1.0kg | Standards | JB/T 10061-1999, JJG 746-2004 |
Continue Working Time | 12h | Warranty | 1 Year |
Key Words | Ultrasonic Flaw Detector | ||
High Light | 12h ultrasonic flaw detection equipment,12H ndt flaw detector,Big Memory ndt flaw detector |
SUD series ultrasonic flaw detectors are portable, microprocessor-based instruments that are suitable for both shop and field use. They are integrated with international advanced digital integration and new EL display technology, are smart Digital Ultrasonic Flaw Detector propelled by SADT. SUD series flaw detectors have almost all functions to meet requirements of professional application for nondestructive testing.
SUD50 is a more portable model with better functions.
Features:
- Automatic calibration of transducer Zero Offset and/or Velocity ;
- Automatic gain, Peak Hold and Peak Memory;
- Automatic display precise flaw location (Depth d, level p, distance s, amplitude, sz dB, ф);
- Automatic switch three staff gauge ((Depth d, level p, distance s);
- 100 independence setup, any criterion can be input freely, we can work in the scene without test block;
- Big memory of 1000 A graph.
- Gate and DAC alarm;Acoustic-Optical alarm;
- RS232/USB port, communication with pc is easy;
- The embeded software can be online updated;
- Li battery, continue working time up to 8 hours;
- Display freeze;
- Automated echo degree;
- Angles and K-value;
- DAC, AVG , TCG , B Scan ;
- AWS;
- Automated calculate the size of the flaw with w ide bottom type in AVG function.
- 6dB DAC functions;
- Provides high contrast viewing of the waveform from bright, direct sunlight to completae darkness and easy to read from all angles;
- Powerful pc software and reports can be export to excel;
Technical Parameters
Designation | Technical Data |
Range of scanning (mm) | Range of scanning (mm): 0~10000 Steps: 2.5,5,10,20, 30,40,50,60,70,80,90, 100,150,200, 250, 300, 350, 400, 450,500,600,700,800,900,1000,2000,3000,4000,5000,6000,7000,8000,10000 Adjusting step: 0.1mm(2.5 mm~99.9mm), 1mm(100mm~10000mm) |
D-delay (µs) | D-delay (µs): -20~+3400 Steps: -20,-10,0.0, 10, 20, 50,100,150,200,250,300,350,400,450,500, 600, 700,800,900,1000,1500,2000,2500,3000,3400. Adjusting steps: 0.1(-20µs~999.9µs), 1(1000µs~3400µs) |
P-delay (µs) | P-delay: 0.0~99.99 Adjusting steps: 0.01 |
MTLVEL(m/s) | MTLVEL: 1000~15000 10 fixed levels: 2260,2730,3080,3230,4700,5920,630012000,13000,14000,15000 Adjusting steps: 1 |
Working mode | Single probe (receiving and sending), double probe (one for receiving and another for sending), transmission (transmission probe) |
Frequency Range (MHz) | 0.5~20 |
Gain adjustment (dB) | 0~120 Adjusting step: 0.0, 0.1, 0.5, 1, 2, 6, 12 |
Reject | 0%~80% of screen height, step: 1% |
Vertical linear error | Vertical linear error is not more than 3% |
Horizontal linear error | Not more than 0.2% in the scanning range |
Sensitivity Leavings | ≥62 dB |
Dynamic range | ≥34dB |
Alarm | Three modes, i.e. forbidden wave, loss wave and auto |
A-Scan display area | Full screen or local A-Scan display freezing and de-freezing A-Scan filling |
Data save | 1000 A-Scan images (including setting of instrument) |
Standard communication interface with PC |
RS232/USB |
Measuring unit | mm/inch |
Battery | Li battery 7.4V 4800mAh |
Power adaptor | Input 100V~240V/50Hz~60Hz Output 9VDC/1.5A |
Working temperature | -20℃~50℃ |
Working humidity | 20%~90% |
Port type | BNC |
Overall dimension (mm) | 50×160×238 |
Weight (kg) | 1.0 |
Sino Age Development Technology, Ltd. (SADT), established in 1993, is a leading manufacturer for measuring and testing instrument, specialized in NDT and quality control fields. We have our own HARTIP series portable hardness testers since 1995. We are professional producer with ISO 9001 quality system. Most of the products are applied with CE certificate.
Now our main products cover hardness tester, ultrasonic thickness gauge, concrete test hammer, gloss meter, colorimeter, roughness tester, metallurgical microscope, ultrasonic flaw detector and so on. We have exported our products in batch quantity to overseas market since 1996. Our main overseas markets are: USA, Canada, Germany, France, Netherlands, Finland, Italy, Czech Republic, Poland, Lithuania, Estonia, Serbia, Russia, Greece, Turkey, Australia, New Zealand, Korea, Taiwan, Singapore, Thailand, Indonesia, Malaysia, Vietnam, India, Pakistan, Iran, UAE, Egypt, South Africa, Mexico and Columbia, Peru and etc. All products supplied by SADT have excellent quality and competitive price with our best service.